Precision in Detail, Limitless in Measurement






Designed for small to medium-sized parts, it accurately captures minor defects and intricate features, ensuring precise measurement of complex curves and contours, such as turbine blades.




It delivers high-fidelity scans of artifacts, sculptures, and glazed surfaces, providing accurate data for digital archiving, restoration, and virtual exhibitions.




Supports ultra-fast scanning, hyper-fine scanning and deep hole scanning, adaptable to diverse scanning needs.

Handles various part sizes and types across indoor and outdoor settings, even under direct sunlight.

Scans textiles, ceramics, bronze, sheet metal, and more without needing spray coatings, protecting the surface from damage.

3D Scan + Texture Mapping
Experience flawless cultural heritage preservation with SCANTECH’s integrated digital workflow powered by robust 3D software and high-resolution texture mapping software. Leveraging high-precision 3D scanning and intelligent texture mapping, it faithfully reproduces colors, textures, and geometry for stunning, lifelike detail.

The NimbleTrack-CR incorporates edge computing for fast and stable data processing. The built-in batteries on both 3D scanner and tracker ensure continuous scanning without external power sources, offering greater flexibility and efficiency in the scanning process.
-On-board computing module
-Built-in batteries
-WNIC design




NimbleTrack boasts an optional module of precise edge detection, which is enabled by gray-value measurement. Users can inspect closed features such as holes, slots, edges precisely and obtain information such as positions and diameters.
i-Probe 500
It can be paired with a tracking i-Probe to probe inaccessible areas such as reference holes and hidden points. This contact measurement probe can ensure precise results with both wired and wireless options.

Its measurement range can be dynamically extended by adding more i-Trackers so that it can measure large-scale objects without compromising accuracy.
Type | NimbleTrack-CR | |
Scan mode | Ultra-fast scanning | 17 blue laser crosses |
Hyperfine scanning | 7 blue parallel laser lines | |
Deep hole scanning | 1 blue laser line | |
Accuracy for scanner-only mode(1) | Up to 0.020 mm | |
Accuracy for system(1) | Up to 0.025 mm | |
Tracking distance per i-Tracker | 3200 mm | |
Volumetric accuracy(2) (Tracking distance 3.2 m) |
0.064 mm | |
Volumetric accuracy (With MSCAN photogrammetry system ) |
0.044 mm + 0.012 mm/m | |
Hole position accuracy | 0.050 mm | |
Laser class | Class II (eye-safe) | |
Resolution up to | 0.010 mm | |
Stand-off distance | 250 mm | |
Depth of field | 300 mm | |
Scanning area up to | 150 mm × 190 mm | |
Scanning frame rate | 120 fps | |
Measurement rate up to | 4,900,000 measurements/s | |
Dimension of i-Scanner | 238 mm × 203 mm × 230 mm | |
Weight of i-Scanner | 1.3 kg (Net weight) |
|
1.4 kg (Battery and wireless module included) | ||
Dimension of i-Tracker | 570 mm × 87 mm × 94 mm | |
Weight of i-Tracker | 2.2 kg (Net weight) | |
2.6 kg (Battery and wireless module included) | ||
Size of protection case | 1000 mm × 425 mm × 280 mm | |
Output format | .stl, .obj, .ply, .asc, .igs, .txt, .mk2, .umk and etc. | |
Operating temperature range | -10°C–40°C | |
Operating humidity (Non-condensation) | 10-90% RH | |
Wireless operating mode | i-Scanner, i-Tracker, i-Scanner + i-Tracker, i-Tracker + i-Probe, Wireless multi-tracker tacking, Edge Inspection | |
Wireless standard | Wi-Fi 6, 802.11a/b/g/n/ac | |
Interface mode | USB 3.0, Gigabit Ethernet | |
Patents | CN109000582B, CN211121096U, CN210567185U, CN111678459B, CN114001696B, CN114554025B, CN114205483B, CN113514008B, CN114627249B, CN112867136B, CN218103220U, CN218103238U, CN307756797S,CN113340234B, CN112964196B, CN115289974B, CN113188476B, CN218411072U, CN115325959B, CN218584004U, CN115661369B, CN218734448U, CN115493512B, CN110992393B, CN116136396B,CN113432561B, CN219834226U, CN219829788U, CN116244730B, CN116206069B, US10309770B2, US10309770B2, US11060853B2, KR102096806B1, EP3392831B1, US11493326B2 | |
(1) ISO 17025 accredited: Based on VDI/VDE 2634 Part 3 standard and JJF 1951 specification, probing error (size) (PS) performance is evaluated. (2) ISO 17025 accredited: Based on VDI/VDE 2634 Part 3 standard and JJF 1951 specification, sphere spacing error (SD) performance is evaluated. |
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We invite you to download our detailed brochure. Scantech provides comprehensive solutions to frequently asked queries about our 3D scanner.